Structural transformations of Ge2Sb2Te5 films studied by electrical resistance measurements

Melville, NY / American Institute of Physics, AIP (2000) [Journal Article]

Journal of applied physics
Volume: 87
Page(s): 4130-4130

Authors

Selected Authors

Friedrich, I.
Weidenhof, V.
Njoroge, Walter Kamande
Franz, P.
Wuttig, Matthias

Identifier